Technische Universität Dresden

Ioannis Messaris

Ioannis Messaris

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Ioannis Messaris, M.Sc.
Technische Universität Dresden
Fakultät Elektrotechnik und Informationstechnik
Institut für Grundlagen der Elektrotechnik und Elektronik
Professur für Grundlagen der Elektrotechnik
Mommsenstr. 12, Toeplerbau, 01069 Dresden


+49 351 463 41133

Chair of fundamentals of electrical engineering

Research Field and Activities

  • Nonlinear Devices
  • Circuit and System Theory
  • Nonlinear Dynamics and Control
  • Memristors and their Applications
  • Cellular Nanoscale/Nonlinear/Neural Networks

Short Biography

Ioannis Messaris received his PhD in Electronics Physics from the Aristotle University of Thessaloniki (AUTH) in 2019. Since 2018 he is a research associate at the Faculty of Electrical and Computer Engineering, Technische Universität Dresden. His research interests lie in the area of memristor theory and modeling, as well as memristor-equipped Cellular Non-linear Networks (M-CNNs). He has been Program Chair and Session Chair for the International Conference on Memristive Materials, Devices, and Systems (MEMRISYS) 2019.

Publication Summary

[1] A. Ascoli, I. Messaris, R. Tetzlaff, and L. O. Chua, “Theoretical Foundations of Memristor Cellular Nonlinear Networks: Stability Analysis with Dynamic Memristors,” IEEE Trans. Circuits Syst. I Regul. Pap., 2020.

[2] R. Tetzlaff, A. Ascoli, I. Messaris, and L. O. Chua, “Theoretical foundations of memristor cellular nonlinear networks: Memcomputing with bistable-like memristors,” IEEE Trans. Circuits Syst. I Regul. Pap., 2020.

[3] I. Messaris, A. Serb, S. Stathopoulos, A. Khiat, S. Nikolaidis, and T. Prodromakis, “A data-driven verilog-A ReRAM model,” IEEE Trans. Comput. Des. Integr. Circuits Syst., 2018.

[4] I. Messaris, C. Galani, M. Ntogramatzi, N. Karagiorgos, P. Chaourani, A. Tzormpatzoglou, S. Goudos, and S. Nikolaidis, “An Evaluation of the Equivalent Inverter Modeling Approach,” Circuits, Syst. Signal Process., 2017.

[5] I. Messaris, T. A. Karatsori, N. Fasarakis, C. G. Theodorou, S. Nikolaidis, G. Ghibaudo, and C. A. Dimitriadis, “Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators,” Microelectron. Reliab., vol. 56, 2016.